Investigation of the structure of gallium oxide glasses by means of positron lifetime measurements
Chem. Met. Alloys 4 (2011) 18-21
Edmund GOLIS, Jacek FILIPECKI, Manuela REBEN, Jan WASYLAK
Positron lifetime spectroscopy PALS has been applied to the investigation of the structure of gallium oxide glasses. Three components of the positron lifetime t (t1 para- and t3 ortho-positronium and t2 intermediate lifetime component) and their intensities I were obtained. The analysis shows that the obtained lifetime components correspond to the occurrence of free volume holes (t1 and t3) and positron trapping in vacancy-type defects (t2). From the Tao-Eldrup formula we can estimate the size of the free volume. The percentage of intensities of the individual components of the positron lifetime shows that it is strongly dominated by vacancy-type defects.
DTA curves of PbO–Bi2O3–Ga2O3 glasses.
Gallium oxide glasses / Positron annihilation / Positronium / Structure of glasses